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X-Rite Ci7500

  • Entry-level benchtop spectrophotometer for formulation and quality control
  • Inter-instrument agreement <0.15ΔE and repeatability of <0.03ΔE
  • Measurement flexibility with switchable reflectance aperatures

An affordable, yet accurate solution for the measurement of reflectance within lab and quality control environments. Suitable for professionals measuring opaque samples, the Ci7500 maximises productivity in any production environment.

Orders dispatched within 10 working days of order confirmation.